Technical Artifacts in Chromatographic Analysis of Tc-99m Radiopharmaceuticals

Abstract

We investigated technical artifacts produced during chromatographic analysis of technetium radiopharmaceuticals. Such artifacts are, we found, caused by improper spotting and drying techniques; these in turn produce spuriously high impurities in Tc-99m complexes of DTPA, MDP, PPi, and GH. The ITLC-SG/acetone system produces considerable streaking of Tc-complex if the applied spot is large and not dried before development. This results in activity in the solvent front portion of the chromatographic strip indicating falsely high levels of pertechnetate impurity. Proper drying of the applied spot eliminates the artifact. The ITLC-SG/saline system yields falsely high, hydrolyzed-reduced technetium impurities if the spot is allowed to enter the solvent during development. Correct spot placement and size eliminate this problem. Strips that are allowed to dry in room air for several minutes may indicate considerable pertechnetate impurity on the chromatogram; yet this may not actually he present in the radiopharmaceutical vial. Drying spots rapidly with hot air or in a nitrogen atmosphere before development eliminates this problem.