Measurements Performed for the Evaluated Instruments
Parameter | ||||||||||
---|---|---|---|---|---|---|---|---|---|---|
Device | Intrinsic uniformity | System uniformity | System resolution | Energy resolution | System sensitivity | Linearity | Tomographic uniformity | Center of rotation | Tomographic resolution | Total performance |
Planar 1 | + | + | + | − | + | + | − | − | − | − |
Planar 2 | + | + | + | − | + | + | − | − | − | − |
Planar 3 | + | + | + | − | + | + | − | − | − | − |
SPECT 1 | + | + | + | + | + | + | + | + | + | + |
SPECT 2 | + | + | + | + | + | + | + | + | + | + |
SPECT 3 | + | + | + | + | + | + | + | + | + | + |
SPECT 4 | + | + | + | + | + | + | + | + | + | + |
SPECT 5 | + | + | + | + | + | + | + | + | + | + |
Planar 4 | + | − | + | − | + | + | − | − | − | − |
Planar 5 | + | − | + | + | + | + | − | − | − | − |
+ = measured parameter; − = not a measured parameter.